CVE-2025-9709

Published: Sep 5, 2025Modified: Jun 17, 2026Deferred

8.6

Vector

CVSS:4.0/AV:P/AC:L/AT:N/PR:N/UI:N/VC:H/VI:H/VA:H/SC:H/SI:H/SA:H/E:X/CR:X/IR:X/AR:X/MAV:X/MAC:X/MAT:X/MPR:X/MUI:X/MVC:X/MVI:X/MVA:X/MSC:X/MSI:X/MSA:X/S:P/AU:X/R:X/V:X/RE:X/U:X

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CVSS:4.0/AV:P/AC:L/AT:N/PR:N/UI:N/VC:H/VI:H/VA:H/SC:H/SI:H/SA:H/E:X/CR:X/IR:X/AR:X/MAV:X/MAC:X/MAT:X/MPR:X/MUI:X/MVC:X/MVI:X/MVA:X/MSC:X/MSI:X/MSA:X/S:P/AU:X/R:X/V:X/RE:X/U:XShow less

Source: 1c6b5737-9389-4011-8117-89fa251edfb2 (Secondary)

Description

On-Chip Debug and Test Interface With Improper Access Control and Improper Protection against Electromagnetic Fault Injection (EM-FI) in Nordic Semiconductor nRF52810 allow attacker to perform EM Fault Injection and bypass APPROTECT at runtime, requiring the least amount of modification to the hardware system possible.

Related CWEs

On-Chip Debug and Test Interface With Improper Access Control

The chip does not implement or does not correctly perform access control to check whether users are authorized to access internal registers and test modes through the physical debug/test interface.

Improper Protection against Electromagnetic Fault Injection (EM-FI)

The device is susceptible to electromagnetic fault injection attacks, causing device internal information to be compromised or security mechanisms to be bypassed.

References (4)

https://nvd.nist.gov/vuln/detail/CVE-2020-27211

Source: 1c6b5737-9389-4011-8117-89fa251edfb2

https://raelize.com/upload/research/2022/No_Hat_2022_-_Glitching_devices_for_code_execution_v1.1.pdf

Source: 1c6b5737-9389-4011-8117-89fa251edfb2

https://raelize.com/upload/research/2025/Dartmouth_202505_False-Injections-Tales-of-Physics-Misconceptions-and-Weird-Machines_v1.1.pdf

Source: 1c6b5737-9389-4011-8117-89fa251edfb2

https://www.toreon.com/cve-2025-9709-major-vulnerability-in-common-chip/

Source: 1c6b5737-9389-4011-8117-89fa251edfb2

Timeline

No history available yet.