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CVE-2024-53017

nvd nist
Published: Jun 3, 2025Modified: Jun 17, 2026

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6.6
Vector
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
Exploitability: 1.8 / Impact: 4.7
Source: product-security@qualcomm.com (Secondary)

Description

Memory corruption while handling test pattern generator IOCTL command.

Affected (4)

Qualcomm
4 products
Sdm429w Firmware
Snapdragon 429 Mobile Platform Firmware
Wcn3620 Firmware
Wcn3660b Firmware
Configuration A
1 vulnerable · 1 platform
Vulnerable SoftwareAffected Versions
Sdm429w Firmware
All versions
Running on/withPlatform Versions
Qualcomm
Sdm429w
All versions
Configuration B
1 vulnerable · 1 platform
Vulnerable SoftwareAffected Versions
Snapdragon 429 Mobile Platform Firmware
All versions
Running on/withPlatform Versions
Qualcomm
Snapdragon 429 Mobile Platform
All versions
Configuration C
1 vulnerable · 1 platform
Vulnerable SoftwareAffected Versions
Wcn3620 Firmware
All versions
Running on/withPlatform Versions
Qualcomm
Wcn3620
All versions
Configuration D
1 vulnerable · 1 platform
Vulnerable SoftwareAffected Versions
Wcn3660b Firmware
All versions
Running on/withPlatform Versions
Qualcomm
Wcn3660b
All versions

Related CWEs

CWE-823
Use of Out-of-range Pointer Offset
The product performs pointer arithmetic on a valid pointer, but it uses an offset that can point outside of the intended range of valid memory locations for the resulting pointer.

References (1)

Source: product-security@qualcomm.com
Vendor Advisory

Timeline

No history available yet.